C Test Coverage Tool

The C Test Coverage tool enables the collection and display of code coverage data on C software source code bases of arbitrary size. It is a member of SD's family of Test Coverage tools.

C Test Coverage Features

Available for ANSI C 89, GCC3 or Microsoft VisualC6 (C99 available on request)
Not dependent on compiler or specific object format
Works with arbitrary subsets of source code base
Can accumulate data from multiple test runs
Handles tens of thousands of files
Extremely low probe overhead both in time and space; bit vector version for embedded systems
Operations to combine Test Coverage data for unions, deltas, intersections
Produces coverage report by application, package and file
Test coverage collection can run on platform separate from Test Coverage tool
User-customizable probe implementation/coverage data extraction enables operation with unusual embedded systems

The C Test Coverage tool has an intuitively simply display. It shows

Possible test coverage vector (TCV) result files
Selected/accumulated/computed TCV files
List of files being tested for coverage
Locations of probe points in files
Browsable source text of file of current interest
Covered/uncovered status of each probe point on file source text
Summary statistics for percentage covered

Here's a screenshot (in a popup window) of the C Test Coverage display. If you have popups disabled, try this link: screen shot

Semantic Designs also offers C Profiler Tools

Have a nonstandard dialect of C or a custom C compiler? Semantic Designs can economically configure a test coverage tool for it.

Thumbs up to Test Coverage tool

"LSI has integrated Semantic Designs' Test Coverage tool into its special firmware build to measure effectiveness of its internal testing. Fantastic support from Sematic Designs and the simplicity of the tool ensured we were able to integrate the tool in our process in just couple of days. Great thing about this tool is, IT JUST WORKS as expected and as advertised. We are already seeing measurable benefits of using the tool. Today, we have quantifiable data to assess our testing methodologies and track the improvements."

Abhijeet Aphale
Lead Engineer
LSI Corporation

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